Special session: Hot topics: Statistical test methods

International audienceThe process of testing Integrated Circuits involves a huge amount of data: electrical circuit measurements, information from wafer process monitors, spatial location of the dies, wafer lot numbers, etc. In addition, the relationships between faults, process variations and circuit performance are likely to be very complex and non-linear. Test (and its extension to diagnosis) should be considered as a challenging highly dimensional multivariate problem.Advanced statistical data processing offers a powerful set of tools, borrowed from the fields of data mining, machine learning or artificial intelligence, to get the most out of this data. Indeed, these mathematical tools have opened a number of novel and interesting research lines within the field of IC testing.In this special session, prominent researchers in this field will share their views on this topic and present some of their last findings. The first talk will discuss the interest of likelihood prevalence in random fault simulation. The second talk will show how statistical data analysis can help diagnosing test efficiency. The third talk will deal with the reliability of Alternate Test of AMS-RF circuits. The fourth and last talk will address the idea of mining the test data for improving design manufacturing and even test itself

Solid state NMR characterization of phenylphosphonic acid encapsulated in SBA-15 and aminopropyl-modified SBA-15

5th International Conference of theă Federation-of-European-Zeolite-Associations (FEZA), Valencia, SPAIN, JULă 03-07, 2011International audienceWe present in this communication that phenyl phosphonic acid can be efficiently loaded in mesoporous SBA-15 and aminopropyl-modified SBA powdered samples through the incipient wetness impregnation method. High amount of phosphonic acid can be reach up to 380 mg/g of sample. We use multinuclear solid state NMR as a method of choice for the indeep characterization of the samples. Thus we demonstrate that phosphonic acid molecules do not crystallize inside the pores. The molecules are highly mobile in SBA-15 because they are submitted to a confinement effect due to the mesoscopic size of the pores and consequently they exhibit a weak interaction with the silica walls. In the case of aminopropyl-modified SBA material, we show that the molecules are rigid and that they are in strong interaction with the aminopropyl groups. Moreover, a 2D double quantum 1H NMR experiment recorded at high field and high spinning speed permit to propose a model of the phosphonate-aminopropyl interaction. The increase in spectral resolution due to the combination of high magnetic field and fast MAS rate allows also the assignment of 1H resonances in aminopropyl-modified SBA matrix and notably allows the assignment of the protons resonance of the amino group

Solid-state nuclear magnetic resonance: A valuable tool to explore organic-inorganic interfaces in silica-based hybrid materials

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Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard

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Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise

International audienceThis paper analyzes the logic errors in digital circuits due to the presence of Simultaneous Switching Noise (SSN). It is demonstrated that 2 conditions must be fulfilled in order to guarantee the correct logic behaviour of a digital circuits. The first condition called ‘Minimum Switch Condition' is proved to be fulfilled whatever the amount of SSN in the power and ground lines. The second condition called ‘Signal Coherence Condition' is proved to be fulfilled within power coherent logic blocks. However the interface between non-coherent logic blocks may originate logic dysfunctio

Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters

International audienceThis paper presents a low-cost approach for testing RF ZigBee transmitters using only a standard digital ATE. The proposed solution permits to implement symbol error detection. The approach is based on 1-bit under-sampled acquisition of the RF signal (2.4GHz OQPSK-modulated signal with half sine pulse shaping). A dedicated post-processing algorithm is then applied, which (i) extracts the phase information from the captured binary sequence, (ii) reconstructs the RF modulated signal and (iii) performs the demodulation. The different steps of the post-processing algorithm are detailed in this paper. The robustness of the post-processing algorithm to various imperfections, both in the signal under test and in the acquisition equipment, are investigated with numerical simulations. Finally, experimental results obtained with NXP ZigBee transceiver fully validate the ability of the proposed method to retrieve the symbol sequence present in the RF modulated signal using the simple binary capture

Study of an electrical setup for capacitive MEMS accelerometers test and calibration

International audienceThis paper deals with the development of a fully electrical method to estimate the sensitivity of capacitive MEMS accelerometers in batch fabrication. The objectives are to test and calibrate them without the need of costly and time-consuming mechanical test equipments. Alternate electrical test measurements are introduced and two methods are evaluated. The first one is based on the analytical study of the relations between the electrical test parameters and the sensitivity. The second one is based on a regression analysis of these relations on a learning batch of sensors. Both are evaluated on a case study accelerometer with Monte Carlo simulations. Applying the methods for calibration shows that the dispersion of the sensitivity can be improved. Results show that the second method is more promising

On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise

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Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers

International audienceIn this paper, different strategies for post-silicon yield improvement of MEMS convective accelerometers are explored. A key feature of the proposed strategies is that they can be implemented at low-cost using electrical test equipment since they only rely on the measurement of the relative deviation of Wheatstone bridge impedance due to power dissipation in the heating element. Different electrical test flows are defined that implement either sensitivity binning, sensitivity calibration, or both. Optionally, an additional constraint can be inserted in the test flows in case power consumption performance has also to be satisfied in addition to sensitivity. The efficiency of the different strategies is evaluated and discussed considering a population of 1,000 devices generated through Monte-Carlo simulation. Finally, experimental measurements that validate the calibration principle are presented

A High Accuracy Triangle-Wave Signal Generator for On-Chip ADC Testing

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